Methods of fabricating MIM capacitors of semiconductor devices

ABSTRACT

Methods of fabricating a MIM capacitor and a dual damascene structure of a semiconductor device are disclosed. A disclosed method comprises forming a first conducting material as a lower interconnect on a semiconductor substrate; sequentially depositing second and third insulating layers over the first conducting layer; performing a first damascene process to form via holes and a trench within the second and the third insulating layers; filling the via holes and the trench to form a first contact plug connected to a lower interconnect and a second contact plug to contact the lower electrode of a MIM capacitor; forming the MIM capacitor over the second contact plug; sequentially depositing fourth and fifth insulating layers over the entire surface of the resulting structure; performing a second damascene process to form a via hole and a trench within the fourth and the fifth insulating layers; and filling the via hole and the trench to form a contact plug in contact with the upper electrode of the capacitor and another contact plug connected to the lower metal interconnect.

FIELD OF THE DISCLOSURE

The present disclosure relates generally to semiconductor devices and,more particularly, to methods of fabricating metal-insulator-metal (MIM)capacitors of semiconductor devices.

BACKGROUND

In recently developed merged memory logic (MML), a memory cell arraysuch as dynamic random access memory (DRAM) and a logic array such asanalog circuits or peripheral circuits are integrated in a single chip.With the advent of MML, multimedia functions have been greatly improvedand, high-integration and high-speed operation of semiconductor deviceshave been more effectively achieved.

On the other hand, to achieve the high-speed operation of analogcircuits, a capacitor with high capacitance is in development.Generally, in a capacitor having a polysilicon-insulator-polysilicon(PIP) structure, the interface between the dielectric and theupper/lower electrodes may be oxidized to form a natural oxide layerbecause the upper and lower electrodes are made of polysilicon. Suchnatural oxide layer may lower the total capacitance of the capacitor. Inaddition, the capacitance of the capacitor may be reduced due todepletion regions which are created in the polysilicon layer. Such acapacitor has a low capacitance and is unsuitable for devices requiringhigh-speed and high-frequency operation.

To obviate these problems, new capacitor structures such asmetal-insulator-silicon (MIS) and metal-insulator-metal (MIM) have beensuggested. The MIM capacitor is widely used in high performancesemiconductor devices because it has low specific resistance and noparasitic capacitance due to depletion regions. Recently, technology forforming a metal interconnect of a semiconductor device by using copperwith low specific resistance instead of aluminum has been introduced.Therefore, various MIM capacitors with copper electrodes are beingsuggested.

FIGS. 1 a and 1 b are cross-sectional views illustrating a conventionalprocess of fabricating a MIM capacitor and a dual damascene structureinterconnect of a semiconductor device. Referring to FIG. 1 a, a lowerinsulating layer 10 is deposited on a semiconductor substrate 1. A firstmetal interconnect 15 and a second metal interconnect 20 are then formedin the lower insulating layer 10. After a metal layer is deposited overthe resulting structure, a portion of the metal layer is removed to forma lower electrode 25 of a capacitor on the second metal interconnect 20.A dielectric layer 30 is then deposited over the semiconductor substrate1 including over the lower capacitor electrode 25. After a second metallayer is deposited on the dielectric layer 30, a portion of the secondmetal layer is removed to form an upper electrode 35 of the capacitor onthe lower electrode 25. Next, an interlayer dielectric (ILD) layer 40 isdeposited over the resulting structure.

Referring to FIG. 1 b, the ILD layer 40 is planarized by a chemicalmechanical polish (CMP) process. Some portion of the ILD layer 40 andthe dielectric layer 30 is then removed by using an etching process toform a via hole V₁ through the ILD layer 40. The via hole V₁ exposes aportion of the top surface of the first metal interconnect 15. Next, afirst trench T₁ is formed in the upper part of the via hole VI. A secondtrench T₂ is formed through the ILD layer 40 on the upper electrode 35.The second trench T₂ exposes a portion of the top surface of the upperelectrode 35. The via hole V₁, the first trench T₁, and the secondtrench T₂ are filled with copper and then planarized by a CMP process.As a result, a damascene structure interconnect 45 and a contact plug 50are completed.

However, the above-described prior art process of fabricating an MIMcapacitor and a dual damascene structure interconnect has severalproblems. First, the above-described process requires an additionalmetal interconnect process to form a metal interconnect to apply a biasto the lower electrode of the capacitor. In addition, theabove-described process is rather complicated because the via hole andthe trench on the upper electrode are formed by using separate unitprocesses.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1 a and 1 b are cross-sectional views illustrating a prior artprocess of fabricating a MIM capacitor and a dual damascene structureinterconnect of a semiconductor device.

FIGS. 2 a through 2 j are cross-sectional views illustrating an exampleprocess of fabricating a MIM capacitor and a dual damascene structureinterconnect of a semiconductor device performed in accordance with theteachings of the present invention.

DETAILED DESCRIPTION

FIGS. 2 a through 2 j are cross-sectional views illustrating an exampleprocess of fabricating a MIM capacitor and a dual damascene structureinterconnect of a semiconductor device. Referring to FIG. 2 a, a firstinsulating layer 21 is deposited on a substrate (not shown) having atleast one active or passive structure (e.g., a transistor or resistor).A mask pattern is formed on the first insulating layer 21. A dry etchingprocess is then performed using the mask pattern as an etch mask to forma trench. A first conducting material is deposited in the trench. A CMPprocess is performed to planarize the surface of the resulting structureto form a first metal interconnect 22. In the illustrated example, theCMP process is performed until the top surface of the first insulatinglayer 21 is exposed. The first conducting material is used to form alower metal interconnect 22 to apply a bias voltage to a lower electrodeof a capacitor to be formed later.

A second insulating layer 23 and a third insulating layer 24 aresequentially deposited over the first insulating layer 21 and the firstconducting material 22. A first mask pattern 25 is formed on the thirdinsulating layer 24. In the illustrated example, the second insulatinglayer 23 is preferably made of a material selected from nitride, siliconcarbide (SiC) and/or aluminum oxide. In the illustrated example, thethird insulating layer 24 is used as an ILD layer and is preferably madeof silicon oxide.

Referring to FIG. 2 b, via holes 26 are formed by performing a dryetching process using the first mask pattern 25. Some of the via holesare used as contact plugs which connect the lower metal interconnect tothe lower electrode of the capacitor. The remainder of the via holes 26function as an interconnect which supplies a bias voltage applied from apad (not shown) to the lower metal interconnect 22.

Referring to FIG. 2 c, a photoresist 27 is spin-coated on the entiresurface of the resulting structure as an insulator. As a result, the viaholes 26 are filled with the photoresist 27. Subsequently, a bakingprocess is performed at a temperature between 250° C. and 350° C. toharden the photoresist 27 within the via holes 26. Next, an etch-backprocess is performed to remove the photoresist which is not within thevia holes 26. Through the damascene process as described above,simplification and efficiency of the control processes are readilyachieved.

Referring to FIG. 2 d, a mask pattern which exposes the area of the viahole 27 a which comes into contact with the pad and covers the otherarea(s) 28 is formed on the surface of the resulting structure.

Referring to FIG. 2 e, a dry etching process is performed using the maskpattern as an etch mask to form a trench 29. The trench area is widerthan the via hole area. Next, a wet etching process is performed toremove the etch mask and, simultaneously, to remove the photoresist 27and the second insulating layer 23 from within the via holes.

Referring to FIG. 2 f, a second conducting material is filled into thevia holes and the trench to form a contact plug 30 connected to thelower interconnect and other contact plugs 31 in contact with the lowerelectrode of the capacitor. In the illustrated example, the secondconducting material is selected from TaN, TiN and/or WN. In addition,the second conducting material may be a single layer of TaN, TiN, or WN,or a multi-layer comprising TaN, TiN, and/or WN. In addition, a Cu layermay be added to the single layer of TaN, TiN, or WN and/or to themulti-layer comprising TaN, TiN, and/or WN. Subsequently, a CMP processis performed to planarize the surface of the resulting structure.

Referring to FIG. 2 g, a metal layer 32 for the lower electrode of thecapacitor, a capacitor insulating layer 33, and a metal layer 34 for theupper electrode of the capacitor are sequentially deposited on the thirdinsulating layer. Next, a photoresist pattern 35 for the MIM capacitoris formed on the metal layer 34 for the upper electrode of the capacitorby a well-known photolithography process. In the illustrated example,the metal layers 32 and 34 for the upper electrode and the lowerelectrode of the capacitor are made of a multi-layer comprising TiNand/or TaN. In addition, in the illustrated example, the capacitorinsulating layer 33 is made of a material such as nitride, TEOS(TetraEthOxySilane) and/or Ta₂O₅.

Referring to FIG. 2 h, a dry-etching process is performed using thephotoresist pattern as an etch mask to form the capacitor including theupper electrode 34, the lower electrode 32, and the capacitor insulatinglayer 33. In other words, the capacitor including the upper electrode34, the lower electrode 32, and the capacitor insulating layer 33 isformed by just one etching process. Therefore, the times of the maskpatterning process is reduced, leading to simplification of the unitprocess. Subsequently, the photoresist pattern is removed, and a fourthinsulating layer 36 is deposited on the surface of the resultingstructure as an etching stop layer.

Referring to FIG. 2 i, a fifth insulating layer 37 is deposited on theentire surface of the resulting structure as an ILD. Subsequently, aphotoresist pattern is formed, which exposes the area for a contact plugfor the upper electrode of the capacitor and the area for a via hole fora contact plug indirectly connected to the lower interconnect.

Referring to FIG. 2 j, an etch process is performed on the fifthinsulating layer 37 until the fourth insulating layer 36 is exposed.Subsequently, the exposed part of the fourth insulating layer 36 on theupper electrode 34 of the capacitor is removed by wet etching. Thus, avia hole and a trench are formed within the fourth and the fifthinsulating layers.

A third conducting material is then filled into the via hole and thetrench. Subsequently, a CMP process is performed to form the contactplug 39 in contact with the upper electrode 34 of the capacitor andanother contact plug 40 indirectly connected to the lower interconnect21. In the illustrated example, the fourth insulating layer 36 ispreferably made of a material such as nitride, silicon carbide oraluminum oxide. The example fifth insulating layer 37 of FIG. 2 j ispreferably made of SiO₂ which is the identical material used in thesecond insulating layer 23. The third conducting material may be asingle layer of TaN, TiN, or WN, or a multi-layer comprising TaN, TiN,and/or WN. In addition, a Cu layer may be added to the single layer ofTaN, TiN, or WN and/or to the multi-layer comprising TaN, TiN, and/or WNfor the third conducting material.

From the foregoing, persons of ordinary skill in the art will appreciatethat the above-described process of fabricating a MIM capacitor and adual damascene structure simultaneously forms both the contact plug andthe capacitor using one unit process, thereby simplifying themanufacturing process and reducing the manufacturing cost.

It is noted that this patent claims priority from Korean PatentApplication Serial Number 10-2003-0102046, which was filed on Dec. 31,2003, and is hereby incorporated by reference in its entirety.

Although certain example methods, apparatus and articles ofmanufacturing have been described herein, the scope of coverage of thispatent is not limited thereto. On the contrary, this patent covers allmethods, apparatus and articles of manufacture fairly falling within thescope of the appended claims either literally or under the doctrine ofequivalents.

1. A method of fabricating a MIM capacitor of a semiconductor devicecomprising: forming a lower interconnect on a semiconductor substrate;sequentially depositing second and third insulating layers over thelower interconnect; performing a first damascene process to form firstand second via holes and a first trench within the second and the thirdinsulating layers; filling the first and second via holes and the firsttrench with a conductive material to form a first contact plug connectedto the lower interconnect and a second contact plug to be in contactwith a lower electrode of a MIM capacitor; forming the MIM capacitorover the second contact plug; sequentially depositing fourth and fifthinsulating layers; performing a second damascene process to form a thirdvia hole and a second trench within the fourth and the fifth insulatinglayers; and filling the third via hole and the second trench to form athird contact plug in contact with the upper electrode of the capacitorand a fourth contact plug connected to the lower interconnect.
 2. Amethod as defined in claim 1, wherein forming the lower interconnectcomprises: depositing a first insulating layer on the substrate; forminga mask pattern through the first insulating layer; dry etching the firstinsulating material using the mask pattern as an etch mask to form atrench; depositing a first conducting material in the trench; andperforming a CMP process to planarize a resulting structure.
 3. A methodas defined in claim 1, wherein performing the first damascene processcomprises: forming the first and second via holes within the thirdinsulating layer; filling a photoresist material into the first andsecond via holes; hardening the photoresist; forming a mask patternexposing the first via hole; forming a trench using the mask pattern asan etch mask; removing the etch mask; and removing the photoresist andthe second insulating layer in the via holes;
 4. A method as defined inclaim 3, wherein the photoresist is hardened at a temperature betweenabout 250° C. and about 350° C.
 5. A method as defined in claim 1,wherein forming the MIM capacitor comprises: sequentially depositing ametal layer for the upper electrode of the capacitor, a capacitorinsulating layer, and a metal layer for the upper electrode of thecapacitor on the third insulating layer; forming a mask pattern for theMIM capacitor on the metal layer for the upper electrode of thecapacitor; and etching metal layer for the upper electrode of thecapacitor, the capacitor insulating layer, and the metal layer for thelower electrode of the capacitor while using the mask pattern as an etchmask.
 6. A method as defined in claim 1, wherein the second and theforth insulating layers comprise at least one of nitride, siliconcarbide or aluminum oxide.
 7. A method as defined in claim 1, whereinthe third insulating layer and the fifth insulating layer comprise SiO₂.8. A method as defined in claim 1, wherein the second and the thirdconducting layers comprises a single layer of TaN, TiN, or WN, or amulti-layer comprising at least one of TaN, TiN, or WN.
 9. A method asdefined in claim 8, wherein a Cu layer is added to the single layer ofTaN, TiN, or WN or to the multi-layer of at least one of TaN, TiN, orWN.
 9. A method as defined in claim 1, wherein the lower electrode andthe upper electrode of the MIM capacitor are multi-layer structurescomprising TaN or TiN.
 10. A method as defined in claim 1, wherein thecapacitor insulating layer comprises nitride, TEOS, or Ta₂O₅.